%0 Journal Article %1 WOS:A1982ND44200038 %A HIPOLITO, O %A FARIAS, GA %C PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS %D 1982 %I ELSEVIER SCIENCE BV %J SURFACE SCIENCE %K imported %N 1-3 %P 228-232 %R 10.1016/0039-6028(82)90590-8 %T ROUGHNESS EFFECTS IN SURFACE-STATES OF SILICON %V 113

@article{WOS:A1982ND44200038, added-at = {2022-05-23T20:00:14.000+0200}, address = {PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS}, author = {HIPOLITO, O and FARIAS, GA}, biburl = {https://www.bibsonomy.org/bibtex/20ca66ae03de28051fb5dc8b98c35241a/ppgfis_ufc_br}, doi = {10.1016/0039-6028(82)90590-8}, interhash = {b1773cbdf3012ae460ac19a257424615}, intrahash = {0ca66ae03de28051fb5dc8b98c35241a}, issn = {0039-6028}, journal = {SURFACE SCIENCE}, keywords = {imported}, number = {1-3}, pages = {228-232}, publisher = {ELSEVIER SCIENCE BV}, pubstate = {published}, timestamp = {2022-05-23T20:00:14.000+0200}, title = {ROUGHNESS EFFECTS IN SURFACE-STATES OF SILICON}, tppubtype = {article}, volume = 113, year = 1982 }