%0 Conference Paper %1 conf/essderc/RackNCLR21 %A Rack, Martin %A Nyssens, Lucas %A Courte, Quentin %A Lederer, Dimitri %A Raskin, Jean-Pierre %B ESSDERC %D 2021 %I IEEE %K dblp %P 195-198 %T Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI. %U http://dblp.uni-trier.de/db/conf/essderc/essderc2021.html#RackNCLR21 %@ 978-1-6654-3748-6

@inproceedings{conf/essderc/RackNCLR21, added-at = {2021-12-24T00:00:00.000+0100}, author = {Rack, Martin and Nyssens, Lucas and Courte, Quentin and Lederer, Dimitri and Raskin, Jean-Pierre}, biburl = {https://www.bibsonomy.org/bibtex/2b836218b08d4eff89fe4d64043332cf7/dblp}, booktitle = {ESSDERC}, crossref = {conf/essderc/2021}, ee = {https://doi.org/10.1109/ESSDERC53440.2021.9631835}, interhash = {003facc637fdd684642a10cdb856b832}, intrahash = {b836218b08d4eff89fe4d64043332cf7}, isbn = {978-1-6654-3748-6}, keywords = {dblp}, pages = {195-198}, publisher = {IEEE}, timestamp = {2024-04-09T10:00:03.000+0200}, title = {Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI.}, url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2021.html#RackNCLR21}, year = 2021 }