%0 Conference Paper %1 conf/ets/RaychowdhuryGBGR05 %A Raychowdhury, Arijit %A Ghosh, Swaroop %A Bhunia, Swarup %A Ghosh, Debjyoti %A Roy, Kaushik %B ETS %D 2005 %I IEEE Computer Society %K dblp %P 108-113 %T A novel delay fault testing methodology using on-chip low-overhead delay measurement hardware at strategic probe points. %U http://dblp.uni-trier.de/db/conf/ets/ets2005.html#RaychowdhuryGBGR05 %@ 0-7695-2341-2

@inproceedings{conf/ets/RaychowdhuryGBGR05, added-at = {2024-05-07T00:00:00.000+0200}, author = {Raychowdhury, Arijit and Ghosh, Swaroop and Bhunia, Swarup and Ghosh, Debjyoti and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/2120429bd385352340a10c6eedf99f756/dblp}, booktitle = {ETS}, crossref = {conf/ets/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/ETS.2005.2}, interhash = {09379ee3e4d463bb76bfec7f886d7ad7}, intrahash = {120429bd385352340a10c6eedf99f756}, isbn = {0-7695-2341-2}, keywords = {dblp}, pages = {108-113}, publisher = {IEEE Computer Society}, timestamp = {2024-05-13T10:05:03.000+0200}, title = {A novel delay fault testing methodology using on-chip low-overhead delay measurement hardware at strategic probe points.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2005.html#RaychowdhuryGBGR05}, year = 2005 }