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%0 Conference Paper
%1 conf/itc/Crosby84
%A Crosby, Brian C.
%B ITC
%D 1984
%I IEEE Computer Society
%K dblp
%P 206-211
%T Adapting CAE Design Information for In-Circuit Test Generation.
%U http://dblp.uni-trier.de/db/conf/itc/itc1984.html#Crosby84
@inproceedings{conf/itc/Crosby84,
added-at = {2002-11-22T00:00:00.000+0100},
author = {Crosby, Brian C.},
biburl = {https://www.bibsonomy.org/bibtex/2f8667a78a1f4c5ac755f0916c66e0aba/dblp},
booktitle = {ITC},
crossref = {conf/itc/1984},
date = {2002-11-22},
description = {dblp},
interhash = {0b0824a3d9eccd0bb88c9c23888b9841},
intrahash = {f8667a78a1f4c5ac755f0916c66e0aba},
keywords = {dblp},
pages = {206-211},
publisher = {IEEE Computer Society},
timestamp = {2002-11-22T00:00:00.000+0100},
title = {Adapting CAE Design Information for In-Circuit Test Generation.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc1984.html#Crosby84},
year = 1984
}