%0 Conference Paper %1 conf/ssiri/WuY014 %A Wu, Tianyong %A Yan, Jun %A Zhang, Jian %B SERE %D 2014 %I IEEE %K dblp %P 118-126 %T Automatic Test Data Generation for Unit Testing to Achieve MC/DC Criterion. %U http://dblp.uni-trier.de/db/conf/ssiri/sere2014.html#WuY014 %@ 978-1-4799-4296-1

@inproceedings{conf/ssiri/WuY014, added-at = {2018-07-11T00:00:00.000+0200}, author = {Wu, Tianyong and Yan, Jun and Zhang, Jian}, biburl = {https://www.bibsonomy.org/bibtex/21e2d2231471bfc94f4e64bf82984b13d/dblp}, booktitle = {SERE}, crossref = {conf/ssiri/2014}, ee = {https://doi.org/10.1109/SERE.2014.25}, interhash = {0012060df801dd64fbf187719f87b041}, intrahash = {1e2d2231471bfc94f4e64bf82984b13d}, isbn = {978-1-4799-4296-1}, keywords = {dblp}, pages = {118-126}, publisher = {IEEE}, timestamp = {2019-10-17T18:48:09.000+0200}, title = {Automatic Test Data Generation for Unit Testing to Achieve MC/DC Criterion.}, url = {http://dblp.uni-trier.de/db/conf/ssiri/sere2014.html#WuY014}, year = 2014 }