%0 Journal Article %1 journals/et/KraussGA97 %A Krauss, Peter A. %A Ganz, Andreas %A Antreich, Kurt %D 1997 %J J. Electron. Test. %K dblp %N 3 %P 227-245 %T Distributed Test Pattern Generation for Stuck-At Faults in Sequential Circuits. %U http://dblp.uni-trier.de/db/journals/et/et11.html#KraussGA97 %V 11

@article{journals/et/KraussGA97, added-at = {2020-09-11T00:00:00.000+0200}, author = {Krauss, Peter A. and Ganz, Andreas and Antreich, Kurt}, biburl = {https://www.bibsonomy.org/bibtex/21fe632cb3edbcfdd2eee0a31b62d49b9/dblp}, ee = {https://doi.org/10.1023/A:1008266422380}, interhash = {03882a09d6e4283b9a4c133a07d74ed8}, intrahash = {1fe632cb3edbcfdd2eee0a31b62d49b9}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 3, pages = {227-245}, timestamp = {2020-09-12T11:40:53.000+0200}, title = {Distributed Test Pattern Generation for Stuck-At Faults in Sequential Circuits.}, url = {http://dblp.uni-trier.de/db/journals/et/et11.html#KraussGA97}, volume = 11, year = 1997 }