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%0 Journal Article
%1 journals/mr/LambertJBOMDTFBM10
%A Lambert, Benoit
%A Jonsson, G.
%A Bataille, J.
%A Ollivier, C.
%A Mezenge, P.
%A Derewonko, H.
%A Thomas, H.
%A Floriot, D.
%A Blanck, Hervé
%A Moreau, C.
%D 2010
%J Microelectron. Reliab.
%K dblp
%N 9-11
%P 1543-1547
%T Reliability of high voltage/high power L/S-band Hbt technology.
%U http://dblp.uni-trier.de/db/journals/mr/mr50.html#LambertJBOMDTFBM10
%V 50
@article{journals/mr/LambertJBOMDTFBM10,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Lambert, Benoit and Jonsson, G. and Bataille, J. and Ollivier, C. and Mezenge, P. and Derewonko, H. and Thomas, H. and Floriot, D. and Blanck, Hervé and Moreau, C.},
biburl = {https://www.bibsonomy.org/bibtex/22bded638ce2c7ca884f53e60c7105369/dblp},
ee = {https://doi.org/10.1016/j.microrel.2010.07.105},
interhash = {09c87004ed7e9b965e8d505936a2dfcf},
intrahash = {2bded638ce2c7ca884f53e60c7105369},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-11},
pages = {1543-1547},
timestamp = {2020-02-25T13:22:55.000+0100},
title = {Reliability of high voltage/high power L/S-band Hbt technology.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#LambertJBOMDTFBM10},
volume = 50,
year = 2010
}