%0 Journal Article %1 journals/jssc/KerCSW11 %A Ker, Ming-Dou %A Chen, Wen-Yi %A Shieh, Wuu-Trong %A Wei, I-Ju %D 2011 %J IEEE J. Solid State Circuits %K dblp %N 2 %P 537-545 %T Electrostatic Discharge Protection Design for High-Voltage Programming Pin in Fully-Silicided CMOS ICs. %U http://dblp.uni-trier.de/db/journals/jssc/jssc46.html#KerCSW11 %V 46

@article{journals/jssc/KerCSW11, added-at = {2020-08-30T00:00:00.000+0200}, author = {Ker, Ming-Dou and Chen, Wen-Yi and Shieh, Wuu-Trong and Wei, I-Ju}, biburl = {https://www.bibsonomy.org/bibtex/267319c28611e4d7f40aaeae4143ff4cf/dblp}, ee = {https://doi.org/10.1109/JSSC.2010.2096114}, interhash = {0ae3beab222d0147ab9a8353e45d7e49}, intrahash = {67319c28611e4d7f40aaeae4143ff4cf}, journal = {IEEE J. Solid State Circuits}, keywords = {dblp}, number = 2, pages = {537-545}, timestamp = {2020-08-31T11:43:41.000+0200}, title = {Electrostatic Discharge Protection Design for High-Voltage Programming Pin in Fully-Silicided CMOS ICs.}, url = {http://dblp.uni-trier.de/db/journals/jssc/jssc46.html#KerCSW11}, volume = 46, year = 2011 }