%0 Conference Paper %1 conf/itc/WangM86 %A Wang, Laung-Terng %A McCluskey, Edward J. %B ITC %D 1986 %I IEEE Computer Society %K dblp %P 25-37 %T Circuits for Pseudo-Exhaustive Test Pattern Generation. %U http://dblp.uni-trier.de/db/conf/itc/itc1986.html#WangM86

@inproceedings{conf/itc/WangM86, added-at = {2002-10-22T00:00:00.000+0200}, author = {Wang, Laung-Terng and McCluskey, Edward J.}, biburl = {https://www.bibsonomy.org/bibtex/222f21ce2f1ef92ffab8adfb15af2216d/dblp}, booktitle = {ITC}, crossref = {conf/itc/1986}, date = {2002-10-22}, description = {dblp}, interhash = {0e4dc5544ebb3565caa9ec8098e881d9}, intrahash = {22f21ce2f1ef92ffab8adfb15af2216d}, keywords = {dblp}, pages = {25-37}, publisher = {IEEE Computer Society}, timestamp = {2002-10-22T00:00:00.000+0200}, title = {Circuits for Pseudo-Exhaustive Test Pattern Generation.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1986.html#WangM86}, year = 1986 }