%0 Journal Article %1 journals/mr/LambertMLVTHBP01 %A Lambert, Benoit %A Malbert, Nathalie %A Labat, Nathalie %A Verdier, Frédéric %A Touboul, André %A Huguet, P. %A Bonnet, R. %A Pataut, G. %D 2001 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1573-1578 %T Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#LambertMLVTHBP01 %V 41

@article{journals/mr/LambertMLVTHBP01, added-at = {2020-02-22T00:00:00.000+0100}, author = {Lambert, Benoit and Malbert, Nathalie and Labat, Nathalie and Verdier, Frédéric and Touboul, André and Huguet, P. and Bonnet, R. and Pataut, G.}, biburl = {https://www.bibsonomy.org/bibtex/20995dba62780eeb0587005fb9a2a2bcd/dblp}, ee = {https://doi.org/10.1016/S0026-2714(01)00186-X}, interhash = {0e5e3032b40570adef2ff1e8dfec58c7}, intrahash = {0995dba62780eeb0587005fb9a2a2bcd}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1573-1578}, timestamp = {2020-02-25T13:26:56.000+0100}, title = {Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#LambertMLVTHBP01}, volume = 41, year = 2001 }