%0 Conference Paper %1 conf/irps/GonzalezMCAJR20 %A González, Mireia Bargallo %A Maestro-Izquierdo, Marcos %A Campabadal, Francesca %A Aldana, Samuel %A Jiménez-Molinos, Francisco %A Roldán, Juan Bautista %B IRPS %D 2020 %I IEEE %K dblp %P 1-4 %T Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors. %U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#GonzalezMCAJR20 %@ 978-1-7281-3199-3

@inproceedings{conf/irps/GonzalezMCAJR20, added-at = {2021-10-14T00:00:00.000+0200}, author = {González, Mireia Bargallo and Maestro-Izquierdo, Marcos and Campabadal, Francesca and Aldana, Samuel and Jiménez-Molinos, Francisco and Roldán, Juan Bautista}, biburl = {https://www.bibsonomy.org/bibtex/2e4c7e20c621a19fb9c3aceddfaada091/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2020}, ee = {https://doi.org/10.1109/IRPS45951.2020.9128961}, interhash = {0ea6ed499a1d2925966be76a5519ecf6}, intrahash = {e4c7e20c621a19fb9c3aceddfaada091}, isbn = {978-1-7281-3199-3}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-04-10T16:56:46.000+0200}, title = {Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#GonzalezMCAJR20}, year = 2020 }