Inproceedings,
Assessing SiCr resistor drift for automotive analog ICs.
K. Stewart, K. Kimura, M. Ring, K. Noldus, P. Hulse, R. Jerome, A. Hasegawa, J. Gambino, and D. Price.IRPS, page 1-4. IEEE, (2021)
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- conf/irps/StewartKRNHJHGP21
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- inproceedings
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- IRPS
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- 2021
- pages
- 1-4
- publisher
- IEEE
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- conf/irps/2021
- ee
- https://doi.org/10.1109/IRPS46558.2021.9405169
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- 978-1-7281-6893-7
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- http://dblp.uni-trier.de/db/conf/irps/irps2021.html#StewartKRNHJHGP21
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- please select -%0 Conference Paper
%1 conf/irps/StewartKRNHJHGP21
%A Stewart, Kevin A.
%A Kimura, Keiichi
%A Ring, Matt
%A Noldus, Koen
%A Hulse, Pat
%A Jerome, Rick C.
%A Hasegawa, Akihiro
%A Gambino, Jeff P.
%A Price, David T.
%B IRPS
%D 2021
%I IEEE
%K dblp
%P 1-4
%T Assessing SiCr resistor drift for automotive analog ICs.
%U http://dblp.uni-trier.de/db/conf/irps/irps2021.html#StewartKRNHJHGP21
%@ 978-1-7281-6893-7
@inproceedings{conf/irps/StewartKRNHJHGP21,
added-at = {2024-10-06T00:00:00.000+0200},
author = {Stewart, Kevin A. and Kimura, Keiichi and Ring, Matt and Noldus, Koen and Hulse, Pat and Jerome, Rick C. and Hasegawa, Akihiro and Gambino, Jeff P. and Price, David T.},
biburl = {https://www.bibsonomy.org/bibtex/23d5307888ad9c36cb64b5369e3befd1a/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2021},
ee = {https://doi.org/10.1109/IRPS46558.2021.9405169},
interhash = {10d2f0075b7537f09035291a5c4c31b4},
intrahash = {3d5307888ad9c36cb64b5369e3befd1a},
isbn = {978-1-7281-6893-7},
keywords = {dblp},
pages = {1-4},
publisher = {IEEE},
timestamp = {2024-10-07T09:55:10.000+0200},
title = {Assessing SiCr resistor drift for automotive analog ICs.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2021.html#StewartKRNHJHGP21},
year = 2021
}