%0 Journal Article %1 journals/mr/LabatMMT04 %A Labat, Nathalie %A Malbert, Nathalie %A Maneux, Cristell %A Touboul, André %D 2004 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1361-1368 %T Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors. %U http://dblp.uni-trier.de/db/journals/mr/mr44.html#LabatMMT04 %V 44

@article{journals/mr/LabatMMT04, added-at = {2020-02-22T00:00:00.000+0100}, author = {Labat, Nathalie and Malbert, Nathalie and Maneux, Cristell and Touboul, André}, biburl = {https://www.bibsonomy.org/bibtex/2008cf69a4ef1c35ec22880522410d164/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.07.035}, interhash = {11b4714785fc09f95f5479fe9e265be6}, intrahash = {008cf69a4ef1c35ec22880522410d164}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1361-1368}, timestamp = {2020-02-25T13:22:12.000+0100}, title = {Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#LabatMMT04}, volume = 44, year = 2004 }