%0 Conference Paper %1 conf/ats/Devanathan05 %A Devanathan, V. R. %B Asian Test Symposium %D 2005 %I IEEE Computer Society %K dblp %P 300-305 %T Novel Bi-partitioned Scan Architecture to Improve Transition Fault Coverage. %U http://dblp.uni-trier.de/db/conf/ats/ats2005.html#Devanathan05 %@ 0-7695-2481-8

@inproceedings{conf/ats/Devanathan05, added-at = {2023-03-24T00:00:00.000+0100}, author = {Devanathan, V. R.}, biburl = {https://www.bibsonomy.org/bibtex/259ae2679e5206f60cc5cd93800559edf/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2005.82}, interhash = {13140abb40b6a9d7a8c8121bcd06c81d}, intrahash = {59ae2679e5206f60cc5cd93800559edf}, isbn = {0-7695-2481-8}, keywords = {dblp}, pages = {300-305}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:05.000+0200}, title = {Novel Bi-partitioned Scan Architecture to Improve Transition Fault Coverage.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2005.html#Devanathan05}, year = 2005 }