%0 Conference Paper %1 conf/iccd/ZengW89 %A Zeng, W. B. %A Wei, D. Z. %B ICCD %D 1989 %I IEEE %K dblp %P 48-51 %T Intelligent backtracking in test generation for combinational circuits. %U http://dblp.uni-trier.de/db/conf/iccd/iccd1989.html#ZengW89 %@ 0-8186-1971-6

@inproceedings{conf/iccd/ZengW89, added-at = {2021-07-28T00:00:00.000+0200}, author = {Zeng, W. B. and Wei, D. Z.}, biburl = {https://www.bibsonomy.org/bibtex/2ae1fd9aa24dec9ee0bb9318445e878ec/dblp}, booktitle = {ICCD}, crossref = {conf/iccd/1989}, ee = {https://doi.org/10.1109/ICCD.1989.63326}, interhash = {13747fa12a39c09435c4e21fad437a08}, intrahash = {ae1fd9aa24dec9ee0bb9318445e878ec}, isbn = {0-8186-1971-6}, keywords = {dblp}, pages = {48-51}, publisher = {IEEE}, timestamp = {2024-04-09T21:17:44.000+0200}, title = {Intelligent backtracking in test generation for combinational circuits.}, url = {http://dblp.uni-trier.de/db/conf/iccd/iccd1989.html#ZengW89}, year = 1989 }