%0 Conference Paper %1 conf/itc/Nigh11 %A Nigh, Phil %B ITC %D 2011 %E Eklow, Bill %E Blanton, R. D. (Shawn) %I IEEE Computer Society %K dblp %P 1 %T Industry leaders panel - How will testing change in the next 10 years? %U http://dblp.uni-trier.de/db/conf/itc/itc2011.html#Nigh11 %@ 978-1-4577-0153-5

@inproceedings{conf/itc/Nigh11, added-at = {2023-03-23T00:00:00.000+0100}, author = {Nigh, Phil}, biburl = {https://www.bibsonomy.org/bibtex/206903db2dd5236659e1e3daac9d17b78/dblp}, booktitle = {ITC}, crossref = {conf/itc/2011}, editor = {Eklow, Bill and Blanton, R. D. (Shawn)}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2011.6139192}, interhash = {138c473a3771f5477a457acdae08a574}, intrahash = {06903db2dd5236659e1e3daac9d17b78}, isbn = {978-1-4577-0153-5}, keywords = {dblp}, pages = 1, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:30:01.000+0200}, title = {Industry leaders panel - How will testing change in the next 10 years?}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2011.html#Nigh11}, year = 2011 }