%0 Conference Paper %1 conf/ats/NakamuraCSF06 %A Nakamura, Yoshiyuki %A Clouqueur, Thomas %A Saluja, Kewal K. %A Fujiwara, Hideo %B ATS %D 2006 %I IEEE %K dblp %P 409-414 %T Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester. %U http://dblp.uni-trier.de/db/conf/ats/ats2006.html#NakamuraCSF06 %@ 0-7695-2628-4

@inproceedings{conf/ats/NakamuraCSF06, added-at = {2022-11-07T00:00:00.000+0100}, author = {Nakamura, Yoshiyuki and Clouqueur, Thomas and Saluja, Kewal K. and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/25edd7c074c7a5702ab78418c891a8018/dblp}, booktitle = {ATS}, crossref = {conf/ats/2006}, ee = {https://doi.org/10.1109/ATS.2006.260963}, interhash = {1680ef0cd9011c500b241f2557e2bdb7}, intrahash = {5edd7c074c7a5702ab78418c891a8018}, isbn = {0-7695-2628-4}, keywords = {dblp}, pages = {409-414}, publisher = {IEEE}, timestamp = {2024-04-09T14:13:59.000+0200}, title = {Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2006.html#NakamuraCSF06}, year = 2006 }