%0 Journal Article %1 journals/tim/HsuHL09 %A Hsu, Chun-Lung %A Ho, Mean-Hom %A Lin, Chin-Feng %D 2009 %J IEEE Trans. Instrumentation and Measurement %K dblp %N 7 %P 2196-2208 %T Novel Built-In Current-Sensor-Based IDDQ Testing Scheme for CMOS Integrated Circuits. %U http://dblp.uni-trier.de/db/journals/tim/tim58.html#HsuHL09 %V 58

@article{journals/tim/HsuHL09, added-at = {2016-03-09T00:00:00.000+0100}, author = {Hsu, Chun-Lung and Ho, Mean-Hom and Lin, Chin-Feng}, biburl = {https://www.bibsonomy.org/bibtex/24b272f8c056c1c96b0d06e2faeee2c79/dblp}, ee = {http://dx.doi.org/10.1109/TIM.2009.2013668}, interhash = {16f39da4d61e76793f8d5db42c94ec74}, intrahash = {4b272f8c056c1c96b0d06e2faeee2c79}, journal = {IEEE Trans. Instrumentation and Measurement}, keywords = {dblp}, number = 7, pages = {2196-2208}, timestamp = {2016-03-10T18:33:00.000+0100}, title = {Novel Built-In Current-Sensor-Based IDDQ Testing Scheme for CMOS Integrated Circuits.}, url = {http://dblp.uni-trier.de/db/journals/tim/tim58.html#HsuHL09}, volume = 58, year = 2009 }