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%0 Journal Article
%1 journals/mr/GerardinGCPG06
%A Gerardin, Simone
%A Griffoni, Alessio
%A Cester, Andrea
%A Paccagnella, Alessandro
%A Ghidini, G.
%D 2006
%J Microelectron. Reliab.
%K dblp
%N 9-11
%P 1669-1672
%T Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress.
%U http://dblp.uni-trier.de/db/journals/mr/mr46.html#GerardinGCPG06
%V 46
@article{journals/mr/GerardinGCPG06,
added-at = {2022-10-02T00:00:00.000+0200},
author = {Gerardin, Simone and Griffoni, Alessio and Cester, Andrea and Paccagnella, Alessandro and Ghidini, G.},
biburl = {https://www.bibsonomy.org/bibtex/26d8e99c07efed9d09f690c2efb844db3/dblp},
ee = {https://doi.org/10.1016/j.microrel.2006.07.052},
interhash = {1791c7fc6205f80a8f512a3a5a731c2a},
intrahash = {6d8e99c07efed9d09f690c2efb844db3},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-11},
pages = {1669-1672},
timestamp = {2024-04-09T02:50:13.000+0200},
title = {Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#GerardinGCPG06},
volume = 46,
year = 2006
}