%0 Journal Article %1 journals/jolpe/WangSKT15 %A Wang, Senling %A Sato, Yasuo %A Kajihara, Seiji %A Takahashi, Hiroshi %D 2015 %J J. Low Power Electron. %K dblp %N 4 %P 528-540 %T Physical Power Evaluation of Low Power Logic-BIST Scheme Using Test Element Group Chip. %U http://dblp.uni-trier.de/db/journals/jolpe/jolpe11.html#WangSKT15 %V 11

@article{journals/jolpe/WangSKT15, added-at = {2020-05-22T00:00:00.000+0200}, author = {Wang, Senling and Sato, Yasuo and Kajihara, Seiji and Takahashi, Hiroshi}, biburl = {https://www.bibsonomy.org/bibtex/20d08921c0ef61d7284e18b0cc2e1226e/dblp}, ee = {https://doi.org/10.1166/jolpe.2015.1410}, interhash = {1913c8cbae86e0b4c471c8eced770b11}, intrahash = {0d08921c0ef61d7284e18b0cc2e1226e}, journal = {J. Low Power Electron.}, keywords = {dblp}, number = 4, pages = {528-540}, timestamp = {2020-05-23T12:25:39.000+0200}, title = {Physical Power Evaluation of Low Power Logic-BIST Scheme Using Test Element Group Chip.}, url = {http://dblp.uni-trier.de/db/journals/jolpe/jolpe11.html#WangSKT15}, volume = 11, year = 2015 }