%0 Journal Article %1 journals/access/CaiHLCYXL20 %A Cai, Chang %A He, Ze %A Liu, Tianqi %A Chen, Gengsheng %A Yu, Jian %A Xu, Liewei %A Liu, Jie %D 2020 %J IEEE Access %K dblp %P 45378-45389 %T Characterization of Heavy Ion Induced SET Features in 22-nm FD-SOI Testing Circuits. %U http://dblp.uni-trier.de/db/journals/access/access8.html#CaiHLCYXL20 %V 8

@article{journals/access/CaiHLCYXL20, added-at = {2020-04-16T00:00:00.000+0200}, author = {Cai, Chang and He, Ze and Liu, Tianqi and Chen, Gengsheng and Yu, Jian and Xu, Liewei and Liu, Jie}, biburl = {https://www.bibsonomy.org/bibtex/22de23085a58b24bbb576df753bd475fa/dblp}, ee = {https://doi.org/10.1109/ACCESS.2020.2978201}, interhash = {19aefe00051c4141a12d7f926c0e9c8a}, intrahash = {2de23085a58b24bbb576df753bd475fa}, journal = {IEEE Access}, keywords = {dblp}, pages = {45378-45389}, timestamp = {2020-04-17T11:49:00.000+0200}, title = {Characterization of Heavy Ion Induced SET Features in 22-nm FD-SOI Testing Circuits.}, url = {http://dblp.uni-trier.de/db/journals/access/access8.html#CaiHLCYXL20}, volume = 8, year = 2020 }