%0 Conference Paper %1 conf/ecctd/PareschiRS07 %A Pareschi, Fabio %A Rovatti, Riccardo %A Setti, Gianluca %B ECCTD %D 2007 %I IEEE %K dblp %P 627-630 %T Second-level testing revisited and applications to NIST SP800-22. %U http://dblp.uni-trier.de/db/conf/ecctd/ecctd2007.html#PareschiRS07 %@ 978-1-4244-1341-6

@inproceedings{conf/ecctd/PareschiRS07, added-at = {2020-09-05T00:00:00.000+0200}, author = {Pareschi, Fabio and Rovatti, Riccardo and Setti, Gianluca}, biburl = {https://www.bibsonomy.org/bibtex/289fadc6a8304fd71edbe9c35185dffbd/dblp}, booktitle = {ECCTD}, crossref = {conf/ecctd/2007}, ee = {https://doi.org/10.1109/ECCTD.2007.4529674}, interhash = {1ca222dcd2cd257f4874cb4851f26d85}, intrahash = {89fadc6a8304fd71edbe9c35185dffbd}, isbn = {978-1-4244-1341-6}, keywords = {dblp}, pages = {627-630}, publisher = {IEEE}, timestamp = {2024-04-09T16:08:12.000+0200}, title = {Second-level testing revisited and applications to NIST SP800-22.}, url = {http://dblp.uni-trier.de/db/conf/ecctd/ecctd2007.html#PareschiRS07}, year = 2007 }