%0 Journal Article %1 journals/mr/ChuaOSPG16 %A Chua, Chung Tah %A Ong, Hock Guan %A Sanchez, Kevin %A Perdu, Philippe %A Gan, Chee Lip %D 2016 %J Microelectron. Reliab. %K dblp %P 199-203 %T Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop. %U http://dblp.uni-trier.de/db/journals/mr/mr64.html#ChuaOSPG16 %V 64

@article{journals/mr/ChuaOSPG16, added-at = {2022-03-23T00:00:00.000+0100}, author = {Chua, Chung Tah and Ong, Hock Guan and Sanchez, Kevin and Perdu, Philippe and Gan, Chee Lip}, biburl = {https://www.bibsonomy.org/bibtex/23b9007a733c46cceae3281a86746ea12/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.07.107}, interhash = {1d9412b8835a785a0e2674013c718384}, intrahash = {3b9007a733c46cceae3281a86746ea12}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {199-203}, timestamp = {2024-04-09T02:50:36.000+0200}, title = {Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#ChuaOSPG16}, volume = 64, year = 2016 }