%0 Conference Paper %1 conf/artcom/GayathriKM09 %A Gayathri, C. V. %A Kayalvizhi, N. %A Mallikadevi, M. %B ARTCom %D 2009 %I IEEE Computer Society %K dblp %P 699-703 %T Generation of New March Tests with Low Test Power and High Fault Coverage by Test Sequence Reordering Using Genetic Algorithm. %U http://dblp.uni-trier.de/db/conf/artcom/artcom2009.html#GayathriKM09 %@ 978-0-7695-3845-7

@inproceedings{conf/artcom/GayathriKM09, added-at = {2023-03-24T00:00:00.000+0100}, author = {Gayathri, C. V. and Kayalvizhi, N. and Mallikadevi, M.}, biburl = {https://www.bibsonomy.org/bibtex/282c03a3269c4423f535e353407e9d825/dblp}, booktitle = {ARTCom}, crossref = {conf/artcom/2009}, ee = {https://doi.ieeecomputersociety.org/10.1109/ARTCom.2009.52}, interhash = {1d96a879f5fcc276bc0c53049fd8e540}, intrahash = {82c03a3269c4423f535e353407e9d825}, isbn = {978-0-7695-3845-7}, keywords = {dblp}, pages = {699-703}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T03:06:55.000+0200}, title = {Generation of New March Tests with Low Test Power and High Fault Coverage by Test Sequence Reordering Using Genetic Algorithm.}, url = {http://dblp.uni-trier.de/db/conf/artcom/artcom2009.html#GayathriKM09}, year = 2009 }