%0 Journal Article %1 journals/tcad/XiePCHC23 %A Xie, Zhiyao %A Pan, Jingyu %A Chang, Chen-Chia %A Hu, Jiang %A Chen, Yiran %D 2023 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 4 %P 1171-1184 %T The Dark Side: Security and Reliability Concerns in Machine Learning for EDA. %U http://dblp.uni-trier.de/db/journals/tcad/tcad42.html#XiePCHC23 %V 42

@article{journals/tcad/XiePCHC23, added-at = {2023-08-28T00:00:00.000+0200}, author = {Xie, Zhiyao and Pan, Jingyu and Chang, Chen-Chia and Hu, Jiang and Chen, Yiran}, biburl = {https://www.bibsonomy.org/bibtex/2275d08a4587e6053929e3afeaf51d913/dblp}, ee = {https://www.wikidata.org/entity/Q114985175}, interhash = {1e74e112f5f1f8fe8187e4fedb4a5c4e}, intrahash = {275d08a4587e6053929e3afeaf51d913}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, month = {April}, number = 4, pages = {1171-1184}, timestamp = {2024-04-08T19:46:45.000+0200}, title = {The Dark Side: Security and Reliability Concerns in Machine Learning for EDA.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad42.html#XiePCHC23}, volume = 42, year = 2023 }