%0 Conference Paper %1 conf/icess/YangM04 %A Yang, Laurence Tianruo %A Muzio, Jon C. %B ICESS %D 2004 %E Wu, Zhaohui %E Chen, Chun %E Guo, Minyi %E Bu, Jiajun %I Springer %K dblp %P 15-24 %T Testing Methodologies for Embedded Systems and Systems-on-Chip. %U http://dblp.uni-trier.de/db/conf/icess/icess2004.html#YangM04 %V 3605 %@ 3-540-28128-2

@inproceedings{conf/icess/YangM04, added-at = {2017-05-26T00:00:00.000+0200}, author = {Yang, Laurence Tianruo and Muzio, Jon C.}, biburl = {https://www.bibsonomy.org/bibtex/2419340a2d741c49347cb03f52532bd82/dblp}, booktitle = {ICESS}, crossref = {conf/icess/2004}, editor = {Wu, Zhaohui and Chen, Chun and Guo, Minyi and Bu, Jiajun}, ee = {https://doi.org/10.1007/11535409_3}, interhash = {1fe6152aa8978bd148ff78d3375111ea}, intrahash = {419340a2d741c49347cb03f52532bd82}, isbn = {3-540-28128-2}, keywords = {dblp}, pages = {15-24}, publisher = {Springer}, series = {Lecture Notes in Computer Science}, timestamp = {2019-07-23T11:39:22.000+0200}, title = {Testing Methodologies for Embedded Systems and Systems-on-Chip.}, url = {http://dblp.uni-trier.de/db/conf/icess/icess2004.html#YangM04}, volume = 3605, year = 2004 }