%0 Journal Article %1 journals/mr/StojadinovicMDDDGD05 %A Stojadinovic, Ninoslav %A Manic, Ivica %A Davidovic, Vojkan %A Dankovic, Danijel %A Djoric-Veljkovic, Snezana %A Golubovic, Snezana %A Dimitrijev, Sima %D 2005 %J Microelectron. Reliab. %K dblp %N 1 %P 115-122 %T Effects of electrical stressing in power VDMOSFETs. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#StojadinovicMDDDGD05 %V 45

@article{journals/mr/StojadinovicMDDDGD05, added-at = {2024-02-05T00:00:00.000+0100}, author = {Stojadinovic, Ninoslav and Manic, Ivica and Davidovic, Vojkan and Dankovic, Danijel and Djoric-Veljkovic, Snezana and Golubovic, Snezana and Dimitrijev, Sima}, biburl = {https://www.bibsonomy.org/bibtex/2578a9a4ae3c27a11b55e12f076e03a54/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.09.002}, interhash = {1ff806021ef9eedf573c1783aa65b1a3}, intrahash = {578a9a4ae3c27a11b55e12f076e03a54}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 1, pages = {115-122}, timestamp = {2024-04-09T02:49:13.000+0200}, title = {Effects of electrical stressing in power VDMOSFETs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#StojadinovicMDDDGD05}, volume = 45, year = 2005 }