%0 Journal Article %1 journals/tcad/AhmedTRB07 %A Ahmed, Nisar %A Tehranipoor, Mohammad %A Ravikumar, C. P. %A Butler, Kenneth M. %D 2007 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 5 %P 896-906 %T Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers. %U http://dblp.uni-trier.de/db/journals/tcad/tcad26.html#AhmedTRB07 %V 26

@article{journals/tcad/AhmedTRB07, added-at = {2020-09-24T00:00:00.000+0200}, author = {Ahmed, Nisar and Tehranipoor, Mohammad and Ravikumar, C. P. and Butler, Kenneth M.}, biburl = {https://www.bibsonomy.org/bibtex/2709025cf9bb90d90daebb6ae77541c84/dblp}, ee = {https://doi.org/10.1109/TCAD.2006.884405}, interhash = {231c3fdc99cd306d6086bbf5e147f0d2}, intrahash = {709025cf9bb90d90daebb6ae77541c84}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 5, pages = {896-906}, timestamp = {2020-09-25T11:45:28.000+0200}, title = {Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad26.html#AhmedTRB07}, volume = 26, year = 2007 }