%0 Conference Paper %1 conf/ats/MichinishiYOKH03 %A Michinishi, Hiroyuki %A Yokohira, Tokumi %A Okamoto, Takuji %A Kobayashi, Toshifumi %A Hondo, Tsutomu %B Asian Test Symposium %D 2003 %I IEEE Computer Society %K dblp %P 406-411 %T Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test. %U http://dblp.uni-trier.de/db/conf/ats/ats2003.html#MichinishiYOKH03 %@ 0-7695-1951-2

@inproceedings{conf/ats/MichinishiYOKH03, added-at = {2023-03-24T00:00:00.000+0100}, author = {Michinishi, Hiroyuki and Yokohira, Tokumi and Okamoto, Takuji and Kobayashi, Toshifumi and Hondo, Tsutomu}, biburl = {https://www.bibsonomy.org/bibtex/24c8320d031865563ec74579139c8f13c/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250846}, interhash = {24c86bdd700c49c0cb2e5b4901184d51}, intrahash = {4c8320d031865563ec74579139c8f13c}, isbn = {0-7695-1951-2}, keywords = {dblp}, pages = {406-411}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:36.000+0200}, title = {Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2003.html#MichinishiYOKH03}, year = 2003 }