%0 Conference Paper %1 conf/itc/Ley09a %A Ley, Adam W. %B ITC %D 2009 %E Roberts, Gordon W. %E Eklow, Bill %I IEEE Computer Society %K dblp %P 1 %T Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes? %U http://dblp.uni-trier.de/db/conf/itc/itc2009.html#Ley09a %@ 978-1-4244-4868-5

@inproceedings{conf/itc/Ley09a, added-at = {2023-03-23T00:00:00.000+0100}, author = {Ley, Adam W.}, biburl = {https://www.bibsonomy.org/bibtex/2e5c778cc77a9f8e74a0269ccedbb2665/dblp}, booktitle = {ITC}, crossref = {conf/itc/2009}, editor = {Roberts, Gordon W. and Eklow, Bill}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2009.5355828}, interhash = {24f72713bea6bd412d7975165ff37aff}, intrahash = {e5c778cc77a9f8e74a0269ccedbb2665}, isbn = {978-1-4244-4868-5}, keywords = {dblp}, pages = 1, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:29:19.000+0200}, title = {Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes?}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2009.html#Ley09a}, year = 2009 }