%0 Conference Paper %1 conf/ispacs/ChinSKAYI16 %A Chin, Koken %A San, Hao %A Kitajima, Atsushi %A Arai, Yoshiaki %A Yamashita, Jun %A Ito, Hisashi %B ISPACS %D 2016 %I IEEE %K dblp %P 1-4 %T Leakage current compensation technique of ESD protection circuit for CMOS operational amplifier. %U http://dblp.uni-trier.de/db/conf/ispacs/ispacs2016.html#ChinSKAYI16 %@ 978-1-5090-0629-8

@inproceedings{conf/ispacs/ChinSKAYI16, added-at = {2021-10-14T00:00:00.000+0200}, author = {Chin, Koken and San, Hao and Kitajima, Atsushi and Arai, Yoshiaki and Yamashita, Jun and Ito, Hisashi}, biburl = {https://www.bibsonomy.org/bibtex/2f41230d0486fbdd99c5f28d3f71aae67/dblp}, booktitle = {ISPACS}, crossref = {conf/ispacs/2016}, ee = {https://doi.org/10.1109/ISPACS.2016.7824722}, interhash = {2714742485171a4fc7b38cd7b46f109f}, intrahash = {f41230d0486fbdd99c5f28d3f71aae67}, isbn = {978-1-5090-0629-8}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-04-10T11:15:45.000+0200}, title = {Leakage current compensation technique of ESD protection circuit for CMOS operational amplifier.}, url = {http://dblp.uni-trier.de/db/conf/ispacs/ispacs2016.html#ChinSKAYI16}, year = 2016 }