Article,

A Multilevel CMOS&\#x02013;MEMS Design Methodology Based on Response Surface Models

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Journal of Microelectromechanical Systems, (2011)
DOI: 10.1109/jmems.2011.2140352

Abstract

We have developed a novel methodology to design systems composed of complementary metal–oxide–semiconductor (CMOS) and microelectromechanical systems (MEMS) parts. This multiscale methodology combines bottom-up modeling and top-down design-space exploration through the following steps: 1) In bottom-up modeling, characteristics of CMOS circuits and MEMS structures are accurately simulated at the circuit and MEMS device level; 2) on the basis of the results of a statistical regression method, these characteristics are abstracted into individual response surface models (RSMs), each with a set of coefficients of design parameters; 3) the models a…(more)

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