%0 Journal Article %1 journals/mj/LiaoCKH12 %A Liao, Yi-Bo %A Chiang, Meng-Hsueh %A Kim, Keunwoo %A Hsu, Wei-Chou %D 2012 %J Microelectron. J. %K dblp %N 5 %P 300-304 %T Assessment of structure variation in silicon nanowire FETs and impact on SRAM. %U http://dblp.uni-trier.de/db/journals/mj/mj43.html#LiaoCKH12 %V 43

@article{journals/mj/LiaoCKH12, added-at = {2020-02-22T00:00:00.000+0100}, author = {Liao, Yi-Bo and Chiang, Meng-Hsueh and Kim, Keunwoo and Hsu, Wei-Chou}, biburl = {https://www.bibsonomy.org/bibtex/2573a46e4c324f907643480165f82428c/dblp}, ee = {https://doi.org/10.1016/j.mejo.2011.12.002}, interhash = {27dbe163bb77ebeaf487376045be4594}, intrahash = {573a46e4c324f907643480165f82428c}, journal = {Microelectron. J.}, keywords = {dblp}, number = 5, pages = {300-304}, timestamp = {2020-02-25T12:58:09.000+0100}, title = {Assessment of structure variation in silicon nanowire FETs and impact on SRAM.}, url = {http://dblp.uni-trier.de/db/journals/mj/mj43.html#LiaoCKH12}, volume = 43, year = 2012 }