%0 Journal Article %1 journals/tie/XuXW15 %A Xu, Zhuxian %A Xu, Fan %A Wang, Fei %D 2015 %J IEEE Trans. Ind. Electron. %K dblp %N 6 %P 3419-3429 %T Junction Temperature Measurement of IGBTs Using Short-Circuit Current as a Temperature-Sensitive Electrical Parameter for Converter Prototype Evaluation. %U http://dblp.uni-trier.de/db/journals/tie/tie62.html#XuXW15 %V 62

@article{journals/tie/XuXW15, added-at = {2020-05-22T00:00:00.000+0200}, author = {Xu, Zhuxian and Xu, Fan and Wang, Fei}, biburl = {https://www.bibsonomy.org/bibtex/2d036eef869e8e855ca6d9ac4676fe1df/dblp}, ee = {https://doi.org/10.1109/TIE.2014.2374575}, interhash = {27f50b67995f48b7716d28eaadb9cbce}, intrahash = {d036eef869e8e855ca6d9ac4676fe1df}, journal = {IEEE Trans. Ind. Electron.}, keywords = {dblp}, number = 6, pages = {3419-3429}, timestamp = {2020-05-23T11:47:07.000+0200}, title = {Junction Temperature Measurement of IGBTs Using Short-Circuit Current as a Temperature-Sensitive Electrical Parameter for Converter Prototype Evaluation.}, url = {http://dblp.uni-trier.de/db/journals/tie/tie62.html#XuXW15}, volume = 62, year = 2015 }