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- BibTeX key
- conf/itc/FanCFVBZK06
- entry type
- inproceedings
- booktitle
- ITC
- year
- 2006
- pages
- 1-10
- publisher
- IEEE Computer Society
- crossref
- conf/itc/2006
- ee
- https://doi.ieeecomputersociety.org/10.1109/TEST.2006.297721
- isbn
- 1-4244-0292-1
- url
- http://dblp.uni-trier.de/db/conf/itc/itc2006.html#FanCFVBZK06
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- please select -%0 Conference Paper
%1 conf/itc/FanCFVBZK06
%A Fan, Yongquan
%A Cai, Yi
%A Fang, Liming
%A Verma, Anant
%A Burchanowski, William
%A Zilic, Zeljko
%A Kumar, Sandeep
%B ITC
%D 2006
%E Davidson, Scott
%E Gattiker, Anne
%I IEEE Computer Society
%K dblp
%P 1-10
%T An Accelerated Jitter Tolerance Test Technique on Ate for 1.5GB/S and 3GB/S Serial-ATA.
%U http://dblp.uni-trier.de/db/conf/itc/itc2006.html#FanCFVBZK06
%@ 1-4244-0292-1
@inproceedings{conf/itc/FanCFVBZK06,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Fan, Yongquan and Cai, Yi and Fang, Liming and Verma, Anant and Burchanowski, William and Zilic, Zeljko and Kumar, Sandeep},
biburl = {https://www.bibsonomy.org/bibtex/2c40ad54a3300d0f0c22da9e2e0d449d7/dblp},
booktitle = {ITC},
crossref = {conf/itc/2006},
editor = {Davidson, Scott and Gattiker, Anne},
ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2006.297721},
interhash = {285f5607587d68051999c520d1b5b134},
intrahash = {c40ad54a3300d0f0c22da9e2e0d449d7},
isbn = {1-4244-0292-1},
keywords = {dblp},
pages = {1-10},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T00:23:16.000+0200},
title = {An Accelerated Jitter Tolerance Test Technique on Ate for 1.5GB/S and 3GB/S Serial-ATA.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2006.html#FanCFVBZK06},
year = 2006
}