%0 Conference Paper %1 conf/irps/GoelDKM15 %A Goel, Nilesh %A Dubey, P. %A Kawa, J. %A Mahapatra, S. %B IRPS %D 2015 %I IEEE %K dblp %P 5 %T Impact of time-zero and NBTI variability on sub-20nm FinFET based SRAM at low voltages. %U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#GoelDKM15 %@ 978-1-4673-7362-3

@inproceedings{conf/irps/GoelDKM15, added-at = {2019-12-23T00:00:00.000+0100}, author = {Goel, Nilesh and Dubey, P. and Kawa, J. and Mahapatra, S.}, biburl = {https://www.bibsonomy.org/bibtex/255e662e3bc46e63bf0ac0c4254c020cc/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2015}, ee = {https://doi.org/10.1109/IRPS.2015.7112783}, interhash = {2863755e3037076c682f114be0aa24dd}, intrahash = {55e662e3bc46e63bf0ac0c4254c020cc}, isbn = {978-1-4673-7362-3}, keywords = {dblp}, pages = 5, publisher = {IEEE}, timestamp = {2019-12-24T11:39:51.000+0100}, title = {Impact of time-zero and NBTI variability on sub-20nm FinFET based SRAM at low voltages.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#GoelDKM15}, year = 2015 }