%0 Conference Paper %1 conf/irps/KendrickCGMSHSW18 %A Kendrick, Chris %A Cook, Michael %A Gambino, Jeff P. %A Myers, T. %A Slezak, J. %A Hirano, T. %A Sano, T. %A Watanabe, Y. %A Ozeki, K. %B IRPS %D 2018 %I IEEE %K dblp %P 4-1 %T Polysilicon resistor stability under voltage stress for safe-operating area characterization. %U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#KendrickCGMSHSW18 %@ 978-1-5386-5479-8

@inproceedings{conf/irps/KendrickCGMSHSW18, added-at = {2022-10-20T00:00:00.000+0200}, author = {Kendrick, Chris and Cook, Michael and Gambino, Jeff P. and Myers, T. and Slezak, J. and Hirano, T. and Sano, T. and Watanabe, Y. and Ozeki, K.}, biburl = {https://www.bibsonomy.org/bibtex/217d32e6caa152e3ca6020b5e4479ffb6/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2018}, ee = {https://doi.org/10.1109/IRPS.2018.8353686}, interhash = {28d8f75fc22514e9dab7db01e9a514b4}, intrahash = {17d32e6caa152e3ca6020b5e4479ffb6}, isbn = {978-1-5386-5479-8}, keywords = {dblp}, pages = {4-1}, publisher = {IEEE}, timestamp = {2024-04-10T16:54:56.000+0200}, title = {Polysilicon resistor stability under voltage stress for safe-operating area characterization.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#KendrickCGMSHSW18}, year = 2018 }