%0 Conference Paper %1 conf/ats/SeikeNOUAMCKTA06 %A Seike, Sanae %A Namura, Ken %A Ohya, Yukio %A Uzzaman, Anis %A Arima, Shinichi %A Meehl, Dale %A Chickermane, Vivek %A Kobayashi, Azumi %A Tanaka, Satoshi %A Adachi, Hiroyuki %B ATS %D 2006 %I IEEE %K dblp %P 415-420 %T Early Life Cycle Yield Learning for Nanometer Devices Using Volume Yield Diagnostics Analysis. %U http://dblp.uni-trier.de/db/conf/ats/ats2006.html#SeikeNOUAMCKTA06 %@ 0-7695-2628-4

@inproceedings{conf/ats/SeikeNOUAMCKTA06, added-at = {2022-11-07T00:00:00.000+0100}, author = {Seike, Sanae and Namura, Ken and Ohya, Yukio and Uzzaman, Anis and Arima, Shinichi and Meehl, Dale and Chickermane, Vivek and Kobayashi, Azumi and Tanaka, Satoshi and Adachi, Hiroyuki}, biburl = {https://www.bibsonomy.org/bibtex/26beb2375be31f433c9e66191c5a52d22/dblp}, booktitle = {ATS}, crossref = {conf/ats/2006}, ee = {https://doi.org/10.1109/ATS.2006.260964}, interhash = {294033692e5287eab8649c2837fad314}, intrahash = {6beb2375be31f433c9e66191c5a52d22}, isbn = {0-7695-2628-4}, keywords = {dblp}, pages = {415-420}, publisher = {IEEE}, timestamp = {2024-04-09T14:13:59.000+0200}, title = {Early Life Cycle Yield Learning for Nanometer Devices Using Volume Yield Diagnostics Analysis.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2006.html#SeikeNOUAMCKTA06}, year = 2006 }