%0 Conference Paper %1 conf/ats/KuoC09 %A Kuo, Feng-Ming %A Chen, Yuan-Shih %B Asian Test Symposium %D 2009 %I IEEE Computer Society %K dblp %P 94-95 %T Yield Ramp up by Scan Chain Diagnosis. %U http://dblp.uni-trier.de/db/conf/ats/ats2009.html#KuoC09 %@ 978-0-7695-3864-8

@inproceedings{conf/ats/KuoC09, added-at = {2023-03-24T00:00:00.000+0100}, author = {Kuo, Feng-Ming and Chen, Yuan-Shih}, biburl = {https://www.bibsonomy.org/bibtex/20c419dcf5e10b0c4351b078312d11fbb/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2009}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2009.70}, interhash = {29dd4b599e19dc622f2e301d11e67b60}, intrahash = {0c419dcf5e10b0c4351b078312d11fbb}, isbn = {978-0-7695-3864-8}, keywords = {dblp}, pages = {94-95}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:37:09.000+0200}, title = {Yield Ramp up by Scan Chain Diagnosis.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2009.html#KuoC09}, year = 2009 }