%0 Conference Paper %1 conf/iccsa/BaekJH05 %A Baek, Dong-Hyun %A Jeong, In-Jae %A Han, Chang Hee %B ICCSA (4) %D 2005 %E Gervasi, Osvaldo %E Gavrilova, Marina L. %E Kumar, Vipin %E Laganà, Antonio %E Lee, Heow Pueh %E Mun, Youngsong %E Taniar, David %E Tan, Chih Jeng Kenneth %I Springer %K dblp %P 222-231 %T Application of Data Mining for Improving Yield in Wafer Fabrication System. %U http://dblp.uni-trier.de/db/conf/iccsa/iccsa2005-4.html#BaekJH05 %V 3483 %@ 3-540-25863-9

@inproceedings{conf/iccsa/BaekJH05, added-at = {2017-05-24T00:00:00.000+0200}, author = {Baek, Dong-Hyun and Jeong, In-Jae and Han, Chang Hee}, biburl = {https://www.bibsonomy.org/bibtex/211640578241221b9e6f1281d204c99ca/dblp}, booktitle = {ICCSA (4)}, crossref = {conf/iccsa/2005-4}, editor = {Gervasi, Osvaldo and Gavrilova, Marina L. and Kumar, Vipin and Laganà, Antonio and Lee, Heow Pueh and Mun, Youngsong and Taniar, David and Tan, Chih Jeng Kenneth}, ee = {https://doi.org/10.1007/11424925_25}, interhash = {29de2782c7056205bf77c34f5e8be369}, intrahash = {11640578241221b9e6f1281d204c99ca}, isbn = {3-540-25863-9}, keywords = {dblp}, pages = {222-231}, publisher = {Springer}, series = {Lecture Notes in Computer Science}, timestamp = {2024-04-09T22:41:24.000+0200}, title = {Application of Data Mining for Improving Yield in Wafer Fabrication System.}, url = {http://dblp.uni-trier.de/db/conf/iccsa/iccsa2005-4.html#BaekJH05}, volume = 3483, year = 2005 }