Inproceedings,
A Robust Completed Local Binary Pattern (RCLBP) for Surface Defect Detection.
N. Gyimah, A. Girma, M. Mahmoud, S. Nateghi, A. Homaifar, and D. Opoku.SMC, page 1927-1934. IEEE, (2021)
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- conf/smc/GyimahGMNHO21
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- inproceedings
- booktitle
- SMC
- year
- 2021
- pages
- 1927-1934
- publisher
- IEEE
- crossref
- conf/smc/2021
- ee
- https://doi.org/10.1109/SMC52423.2021.9659140
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- 978-1-6654-4207-7
- url
- http://dblp.uni-trier.de/db/conf/smc/smc2021.html#GyimahGMNHO21
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%1 conf/smc/GyimahGMNHO21
%A Gyimah, Nana Kankam
%A Girma, Abenezer
%A Mahmoud, Mahmoud Nabil
%A Nateghi, Shamila
%A Homaifar, Abdollah
%A Opoku, Daniel
%B SMC
%D 2021
%I IEEE
%K dblp
%P 1927-1934
%T A Robust Completed Local Binary Pattern (RCLBP) for Surface Defect Detection.
%U http://dblp.uni-trier.de/db/conf/smc/smc2021.html#GyimahGMNHO21
%@ 978-1-6654-4207-7
@inproceedings{conf/smc/GyimahGMNHO21,
added-at = {2022-01-11T00:00:00.000+0100},
author = {Gyimah, Nana Kankam and Girma, Abenezer and Mahmoud, Mahmoud Nabil and Nateghi, Shamila and Homaifar, Abdollah and Opoku, Daniel},
biburl = {https://www.bibsonomy.org/bibtex/2a628aef8768dc7b35a7cb67d4ba7866c/dblp},
booktitle = {SMC},
crossref = {conf/smc/2021},
ee = {https://doi.org/10.1109/SMC52423.2021.9659140},
interhash = {2a682e5b0a7c1a80683aea30f8a92b6a},
intrahash = {a628aef8768dc7b35a7cb67d4ba7866c},
isbn = {978-1-6654-4207-7},
keywords = {dblp},
pages = {1927-1934},
publisher = {IEEE},
timestamp = {2024-04-09T19:25:11.000+0200},
title = {A Robust Completed Local Binary Pattern (RCLBP) for Surface Defect Detection.},
url = {http://dblp.uni-trier.de/db/conf/smc/smc2021.html#GyimahGMNHO21},
year = 2021
}