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%0 Conference Paper
%1 conf/ets/XamaCEDVG17
%A Xama, Nektar
%A Coyette, Anthony
%A Esen, Baris
%A Dobbelaere, Wim
%A Vanhooren, Ronny
%A Gielen, Georges G. E.
%B ETS
%D 2017
%I IEEE
%K dblp
%P 1-6
%T Automatic testing of analog ICs for latent defects using topology modification.
%U http://dblp.uni-trier.de/db/conf/ets/ets2017.html#XamaCEDVG17
%@ 978-1-5090-5457-2
@inproceedings{conf/ets/XamaCEDVG17,
added-at = {2019-10-19T00:00:00.000+0200},
author = {Xama, Nektar and Coyette, Anthony and Esen, Baris and Dobbelaere, Wim and Vanhooren, Ronny and Gielen, Georges G. E.},
biburl = {https://www.bibsonomy.org/bibtex/2eb4f05f34a0c8c12e8d1c0d72dbbc40d/dblp},
booktitle = {ETS},
crossref = {conf/ets/2017},
ee = {https://doi.org/10.1109/ETS.2017.7968215},
interhash = {2c632c563017dab92480c1d241d1c016},
intrahash = {eb4f05f34a0c8c12e8d1c0d72dbbc40d},
isbn = {978-1-5090-5457-2},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE},
timestamp = {2019-10-22T15:56:55.000+0200},
title = {Automatic testing of analog ICs for latent defects using topology modification.},
url = {http://dblp.uni-trier.de/db/conf/ets/ets2017.html#XamaCEDVG17},
year = 2017
}