%0 Conference Paper %1 conf/ats/ChunKKYK08 %A Chun, Sunghoon %A Kim, YongJoon %A Kim, Taejin %A Yang, Myung-Hoon %A Kang, Sungho %B ATS %D 2008 %I IEEE Computer Society %K dblp %P 83-88 %T XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults. %U http://dblp.uni-trier.de/db/conf/ats/ats2008.html#ChunKKYK08 %@ 978-0-7695-3396-4

@inproceedings{conf/ats/ChunKKYK08, added-at = {2024-02-27T00:00:00.000+0100}, author = {Chun, Sunghoon and Kim, YongJoon and Kim, Taejin and Yang, Myung-Hoon and Kang, Sungho}, biburl = {https://www.bibsonomy.org/bibtex/2d731394f6177883ae86be6410b7d8b4a/dblp}, booktitle = {ATS}, crossref = {conf/ats/2008}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2008.57}, interhash = {2d1c846f1661b79351e7aa083f1538bd}, intrahash = {d731394f6177883ae86be6410b7d8b4a}, isbn = {978-0-7695-3396-4}, keywords = {dblp}, pages = {83-88}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:37:03.000+0200}, title = {XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2008.html#ChunKKYK08}, year = 2008 }