%0 Conference Paper %1 conf/ets/PatelWS18 %A Patel, Dhruv %A Wright, Derek %A Sachdev, Manoj %B ETS %D 2018 %I IEEE %K dblp %P 1-6 %T Sense amplifier offset characterisation and test implications for low-voltage SRAMs in 65 nm. %U http://dblp.uni-trier.de/db/conf/ets/ets2018.html#PatelWS18 %@ 978-1-5386-3728-9

@inproceedings{conf/ets/PatelWS18, added-at = {2022-09-22T00:00:00.000+0200}, author = {Patel, Dhruv and Wright, Derek and Sachdev, Manoj}, biburl = {https://www.bibsonomy.org/bibtex/2847134fec304086477bae430348f4351/dblp}, booktitle = {ETS}, crossref = {conf/ets/2018}, ee = {https://doi.org/10.1109/ETS.2018.8400696}, interhash = {2d5282b4ef0659b4d25c9ee8a783140e}, intrahash = {847134fec304086477bae430348f4351}, isbn = {978-1-5386-3728-9}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-10T20:48:19.000+0200}, title = {Sense amplifier offset characterisation and test implications for low-voltage SRAMs in 65 nm.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2018.html#PatelWS18}, year = 2018 }