%0 Journal Article %1 journals/mr/BuonomoWLCC18 %A Buonomo, Marco %A Wrachien, Nicola %A Lago, Nicolò %A Cantarella, Giuseppe %A Cester, Andrea %D 2018 %J Microelectron. Reliab. %K dblp %P 882-886 %T Effects of stair case gate bias stress in IGZO/Al2O3 flexible TFTs. %U http://dblp.uni-trier.de/db/journals/mr/mr88.html#BuonomoWLCC18 %V 88-90

@article{journals/mr/BuonomoWLCC18, added-at = {2022-12-07T00:00:00.000+0100}, author = {Buonomo, Marco and Wrachien, Nicola and Lago, Nicolò and Cantarella, Giuseppe and Cester, Andrea}, biburl = {https://www.bibsonomy.org/bibtex/2f7993ddf7603d63b21d2ef2ee66febbb/dblp}, ee = {https://doi.org/10.1016/j.microrel.2018.06.056}, interhash = {2d92839aa6c68bf1f582a61b8d9d41b1}, intrahash = {f7993ddf7603d63b21d2ef2ee66febbb}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {882-886}, timestamp = {2024-04-09T02:49:28.000+0200}, title = {Effects of stair case gate bias stress in IGZO/Al2O3 flexible TFTs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr88.html#BuonomoWLCC18}, volume = {88-90}, year = 2018 }