%0 Conference Paper %1 conf/vlsid/ShikhaJPBJ22 %A Shikha, U. S. %A James, Rekha K. %A Pradeep, Anju %A Baby, Sumi %A Jacob, Jobymol %B VLSID %D 2022 %I IEEE %K dblp %P 287-291 %T Threshold Voltage Modeling of Negative Capacitance Double Gate TFET. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2022.html#ShikhaJPBJ22 %@ 978-1-6654-8505-0

@inproceedings{conf/vlsid/ShikhaJPBJ22, added-at = {2023-09-30T00:00:00.000+0200}, author = {Shikha, U. S. and James, Rekha K. and Pradeep, Anju and Baby, Sumi and Jacob, Jobymol}, biburl = {https://www.bibsonomy.org/bibtex/20953cb22a55748683e63ba2f2c72d88f/dblp}, booktitle = {VLSID}, crossref = {conf/vlsid/2022}, ee = {https://doi.org/10.1109/VLSID2022.2022.00062}, interhash = {2ecfa8f9f8cd713b4b4b7a5650805c8f}, intrahash = {0953cb22a55748683e63ba2f2c72d88f}, isbn = {978-1-6654-8505-0}, keywords = {dblp}, pages = {287-291}, publisher = {IEEE}, timestamp = {2024-04-10T01:05:21.000+0200}, title = {Threshold Voltage Modeling of Negative Capacitance Double Gate TFET.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2022.html#ShikhaJPBJ22}, year = 2022 }