%0 Conference Paper %1 conf/irps/ZhouWLGS23 %A Zhou, Huimei %A Wang, Miaomiao %A Loubet, Nicolas %A Gaul, Andrew %A Sulehria, Yasir %B IRPS %D 2023 %I IEEE %K dblp %P 1-6 %T Impact of Gate Stack Thermal Budget on NBTI Reliability in Gate-All-Around Nanosheet P-type Devices. %U http://dblp.uni-trier.de/db/conf/irps/irps2023.html#ZhouWLGS23 %@ 978-1-6654-5672-2

@inproceedings{conf/irps/ZhouWLGS23, added-at = {2023-06-28T00:00:00.000+0200}, author = {Zhou, Huimei and Wang, Miaomiao and Loubet, Nicolas and Gaul, Andrew and Sulehria, Yasir}, biburl = {https://www.bibsonomy.org/bibtex/2b56eee232c78bc5fe892238501af1efe/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2023}, ee = {https://doi.org/10.1109/IRPS48203.2023.10117828}, interhash = {2f11e568d1bf2be81f7a3325df73f473}, intrahash = {b56eee232c78bc5fe892238501af1efe}, isbn = {978-1-6654-5672-2}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:52.000+0200}, title = {Impact of Gate Stack Thermal Budget on NBTI Reliability in Gate-All-Around Nanosheet P-type Devices.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2023.html#ZhouWLGS23}, year = 2023 }