%0 Journal Article %1 journals/todaes/JunPMKH19 %A Jun, Jaeyung %A Paik, Yoonah %A Min, Gyeong Il %A Kim, Seon Wook %A Han, Youngsun %D 2019 %J ACM Trans. Design Autom. Electr. Syst. %K dblp %N 4 %P 47:1-47:25 %T Fault Tolerance Technique Offlining Faulty Blocks by Heap Memory Management. %U http://dblp.uni-trier.de/db/journals/todaes/todaes24.html#JunPMKH19 %V 24

@article{journals/todaes/JunPMKH19, added-at = {2022-01-08T00:00:00.000+0100}, author = {Jun, Jaeyung and Paik, Yoonah and Min, Gyeong Il and Kim, Seon Wook and Han, Youngsun}, biburl = {https://www.bibsonomy.org/bibtex/22c63198b7934c51a0f65bfab8bfa15ce/dblp}, ee = {https://doi.org/10.1145/3329079}, interhash = {302105cf9893a9639a4f4ede7707245c}, intrahash = {2c63198b7934c51a0f65bfab8bfa15ce}, journal = {ACM Trans. Design Autom. Electr. Syst.}, keywords = {dblp}, number = 4, pages = {47:1-47:25}, timestamp = {2024-04-08T21:43:16.000+0200}, title = {Fault Tolerance Technique Offlining Faulty Blocks by Heap Memory Management.}, url = {http://dblp.uni-trier.de/db/journals/todaes/todaes24.html#JunPMKH19}, volume = 24, year = 2019 }