%0 Journal Article %1 journals/tim/KlennerZHKSA16 %A Klenner, Mathias %A Zech, Christian %A Hülsmann, Axel %A Kuhn, Jutta %A Schlechtweg, Michael %A Ambacher, Oliver %D 2016 %J IEEE Trans. Instrumentation and Measurement %K dblp %N 11 %P 2551-2559 %T Spectroscopic Measurement of Material Properties Using an Improved Millimeter-Wave Ellipsometer Based on Metallic Substrates. %U http://dblp.uni-trier.de/db/journals/tim/tim65.html#KlennerZHKSA16 %V 65

@article{journals/tim/KlennerZHKSA16, added-at = {2016-10-11T00:00:00.000+0200}, author = {Klenner, Mathias and Zech, Christian and Hülsmann, Axel and Kuhn, Jutta and Schlechtweg, Michael and Ambacher, Oliver}, biburl = {https://www.bibsonomy.org/bibtex/25c3dad1c42208993787ba47ff6e574fa/dblp}, ee = {http://dx.doi.org/10.1109/TIM.2016.2594022}, interhash = {30f4858c127139cd61540889f216e288}, intrahash = {5c3dad1c42208993787ba47ff6e574fa}, journal = {IEEE Trans. Instrumentation and Measurement}, keywords = {dblp}, number = 11, pages = {2551-2559}, timestamp = {2016-10-12T11:34:01.000+0200}, title = {Spectroscopic Measurement of Material Properties Using an Improved Millimeter-Wave Ellipsometer Based on Metallic Substrates.}, url = {http://dblp.uni-trier.de/db/journals/tim/tim65.html#KlennerZHKSA16}, volume = 65, year = 2016 }