%0 Journal Article %1 journals/mr/ZmeckPBOWBNSFB01 %A Zmeck, M. %A Phang, J. C. H. %A Bettiol, Andrew %A Osipowicz, T. %A Watt, F. %A Balk, L. J. %A Niedernostheide, Franz-Josef %A Schulze, Hans-Joachim %A Falck, E. %A Barthelmess, R. %D 2001 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1519-1524 %T Analysis of high-power devices using proton beam induced charge microscopy. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#ZmeckPBOWBNSFB01 %V 41

@article{journals/mr/ZmeckPBOWBNSFB01, added-at = {2020-11-05T00:00:00.000+0100}, author = {Zmeck, M. and Phang, J. C. H. and Bettiol, Andrew and Osipowicz, T. and Watt, F. and Balk, L. J. and Niedernostheide, Franz-Josef and Schulze, Hans-Joachim and Falck, E. and Barthelmess, R.}, biburl = {https://www.bibsonomy.org/bibtex/214e53e853b79d1726b77ff5dbd1d37aa/dblp}, ee = {https://doi.org/10.1016/S0026-2714(01)00159-7}, interhash = {3196e086cf4e02a0eae5e856ca5c1044}, intrahash = {14e53e853b79d1726b77ff5dbd1d37aa}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1519-1524}, timestamp = {2020-11-06T11:35:28.000+0100}, title = {Analysis of high-power devices using proton beam induced charge microscopy.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#ZmeckPBOWBNSFB01}, volume = 41, year = 2001 }